default search action
"Similarity measures for automatic defect detection on patterned textures."
V. Asha, Nagappa U. Bhajantri, P. Nagabhushan (2012)
- V. Asha, Nagappa U. Bhajantri, P. Nagabhushan:
Similarity measures for automatic defect detection on patterned textures. Int. J. Inf. Commun. Technol. 4(2/3/4): 118-131 (2012)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.