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"Modeling of Transfer Impedance in Automotive BCI Test System with ..."

Junesang Lee et al. (2020)

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DOI: 10.1587/TRANSCOM.2019EBP3144

access: closed

type: Journal Article

metadata version: 2021-10-14

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  dblp key:
  - journals/ieicetb/LeeLHKYKN20
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  persistent URL:
  - https://dblp.org/rec/journals/ieicetb/LeeLHKYKN20
Junesang Lee, Hosang Lee, Jungrae Ha, Minho Kim, Sangwon Yun, Yeongsik Kim, Wansoo Nah:
Modeling of Transfer Impedance in Automotive BCI Test System with Closed-Loop Method. IEICE Trans. Commun. 103-B(4): 405-414 (2020)

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