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"The Number of Elements in Minimum Test Set for Locally Exhaustive Testing ..."

Tokumi Yokohira et al. (1995)

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DOI: —

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/YokohiraSMSO95
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  - https://dblp.org/rec/journals/ieicet/YokohiraSMSO95
Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto:
The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs. IEICE Trans. Inf. Syst. 78-D(7): 874-881 (1995)

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