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"Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide ..."

Michel Renovell et al. (2003)

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DOI: 10.1023/A:1024683708105

access: closed

type: Journal Article

metadata version: 2020-09-11

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Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand:
Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. J. Electron. Test. 19(4): 377-386 (2003)

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