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"Model construction and parameter effect for TFT-LCD process based on yield ..."

Kun-Lin Hsieh, Yen-Sheng Lu (2008)

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DOI: 10.1016/J.ESWA.2006.10.014

access: closed

type: Journal Article

metadata version: 2017-05-26

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  - https://dblp.org/rec/journals/eswa/HsiehL08
Kun-Lin Hsieh, Yen-Sheng Lu:
Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression. Expert Syst. Appl. 34(1): 717-724 (2008)

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