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"The application of clustering analysis for the critical areas on TFT-LCD ..."

Kun-Lin Hsieh (2008)

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DOI: 10.1016/J.ESWA.2006.10.035

access: closed

type: Journal Article

metadata version: 2017-05-26

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Kun-Lin Hsieh:
The application of clustering analysis for the critical areas on TFT-LCD panel. Expert Syst. Appl. 34(2): 952-957 (2008)

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