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"An Error-Tolerance-Based Test Methodology to Support Product Grading for ..."

Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer (2011)

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DOI: 10.1109/TCAD.2011.2113690

access: closed

type: Journal Article

metadata version: 2020-09-24

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Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
An Error-Tolerance-Based Test Methodology to Support Product Grading for Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(6): 930-934 (2011)

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