st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS.">st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS., dblp, computer science, bibliography, knowledge graph, author, editor, publication, conference, journal, book, thesis, database, collection, open data, bibtex">

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"HiSIM-RP: A reverse-profiling based 1st principles compact ..."

Hironori Sakamoto et al. (2012)

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DOI: 10.1109/ISQED.2012.6187548

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Hironori Sakamoto, Shigetaka Kumashiro, Shigeo Sato, Naoki Wakita, Tohru Mogami:
HiSIM-RP: A reverse-profiling based 1^st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS. ISQED 2012: 553-560

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