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"Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed ..."

Stephen A. Mancini et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764538

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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  dblp key:
  - conf/irps/ManciniJCKLLRKA22
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  - https://dblp.org/rec/conf/irps/ManciniJCKLLRKA22
Stephen A. Mancini, Seung Yup Jang, Zeyu Chen, Dongyoung Kim, Justin Lynch, Yafei Liu, Balaji Raghothamachar, Minseok Kang, Anant Agarwal, Nadeemullah Mahadik, Robert Stahlbush, Michael Dudley, Woongje Sung:
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures. IRPS 2022: 62-1

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