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"Smart Sampling for Efficient System Level Test: A Robust Machine Learning ..."

Chenwei Liu, Jie Ou (2021)

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DOI: 10.1109/ITC50571.2021.00013

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-29

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Chenwei Liu, Jie Ou:
Smart Sampling for Efficient System Level Test: A Robust Machine Learning Approach. ITC 2021: 53-62

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