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"A Methodology to Design Efficient BIST Test Pattern Generators."

Chih-Ang Chen, Sandeep K. Gupta (1995)

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DOI: 10.1109/TEST.1995.529913

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/ChenG95
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  persistent URL:
  - https://dblp.org/rec/conf/itc/ChenG95
Chih-Ang Chen, Sandeep K. Gupta:
A Methodology to Design Efficient BIST Test Pattern Generators. ITC 1995: 814-823

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