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"RTL design validation, DFT and test pattern generation for high defects ..."

Marcelino B. Santos et al. (2001)

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DOI: 10.1109/ETW.2001.946672

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-05

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Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL design validation, DFT and test pattern generation for high defects coverage. ETW 2001: 99-105

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