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"Towards a Formal Framework for Product Line Test Development."

Sungwon Kang et al. (2007)

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DOI: 10.1109/CIT.2007.40

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/IEEEcit/KangLKL07
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  persistent URL:
  - https://dblp.org/rec/conf/IEEEcit/KangLKL07
Sungwon Kang, Jihyun Lee, Myungchul Kim, Woojin Lee:
Towards a Formal Framework for Product Line Test Development. CIT 2007: 921-926

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