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"Assessing conformance of pattern-based design in UML."

Jaeyong Park, David C. Rine, Elizabeth White (2008)

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DOI: 10.1145/1593105.1593185

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/ACMse/ParkRW08
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Jaeyong Park, David C. Rine, Elizabeth White:
Assessing conformance of pattern-based design in UML. ACM Southeast Regional Conference 2008: 298-303

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