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Davide Sabena
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2020 – today
- 2022
- [j3]Boyang Du
, Sarah Azimi
An Automated Continuous Integration Multitest Platform for Automotive Systems. IEEE Syst. J. 16(2): 2495-2506 (2022)
2010 – 2019
- 2015
- [b1]Davide Sabena:
New Test and Fault Tolerance Techniques for Reliability Characterization of Parallel and Reconfigurable Processors. Polytechnic University of Turin, Italy, 2015 - 2014
- [j2]Davide Sabena, Matteo Sonza Reorda
Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results. Microelectron. Reliab. 54(11): 2621-2628 (2014) - [j1]Davide Sabena, Matteo Sonza Reorda
On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 813-823 (2014) - [c13]Davide Sabena, Luca Sterpone
Reconfigurable high performance architectures: How much are they ready for safety-critical applications? ETS 2014: 1-8 - [c12]M. De Carvalho, Davide Sabena, Matteo Sonza Reorda
Fault injection in GPGPU cores to validate and debug robust parallel applications. IOLTS 2014: 210-211 - [c11]Davide Sabena, Matteo Sonza Reorda
Soft error effects analysis and mitigation in VLIW safety-critical applications. VLSI-SoC 2014: 1-6 - 2013
- [c10]Luca Sterpone
Dynamic neutron testing of Dynamically Reconfigurable Processing Modules architecture. AHS 2013: 184-188 - [c9]Davide Sabena, Matteo Sonza Reorda
On the evaluation of soft-errors detection techniques for GPGPUs. IDT 2013: 1-6 - [c8]Davide Sabena, Matteo Sonza Reorda
On the development of diagnostic test programs for VLIW processors. VLSI-SoC 2013: 84-89 - [c7]Davide Sabena, Matteo Sonza Reorda
Partition-Based Faults Diagnosis of a VLIW Processor. VLSI-SoC (Selected Papers) 2013: 208-226 - 2012
- [c6]Davide Sabena, Matteo Sonza Reorda
A new SBST algorithm for testing the register file of VLIW processors. DATE 2012: 412-417 - [c5]Davide Sabena, Matteo Sonza Reorda
On the development of Software-Based Self-Test methods for VLIW processors. DFT 2012: 25-30 - [c4]Luca Sterpone
A New Fault Injection Approach for Testing Network-on-Chips. PDP 2012: 530-535 - [c3]Davide Sabena, Matteo Sonza Reorda
On the optimized generation of Software-Based Self-Test programs for VLIW processors. VLSI-SoC 2012: 129-134 - [c2]Davide Sabena, Luca Sterpone
On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors. VLSI-SoC (Selected Papers) 2012: 162-180 - 2011
- [c1]Luca Sterpone
Fault injection analysis of transient faults in clustered VLIW processors. DDECS 2011: 207-212
Coauthor Index
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