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Shin Hong

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2020 – today

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2024
[j9]
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Jeewoong Kim, Shin Hong:
BugOss: A benchmark of real-world regression bugs for empirical investigation of regression fuzzing techniques. J. Syst. Softw. 216: 112119 (2024)
2023
[j8]
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Antonia Bertolino, Shin Hong, Aditya P. Mathur:
Introduction to the special issue on automation of software test and test code quality. J. Softw. Evol. Process. 35(4) (2023)
[c19]
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Jeewoong Kim, Shin Hong:
Poster: BugOss: A Regression Bug Benchmark for Empirical Study of Regression Fuzzing Techniques. ICST 2023: 470-473
2022
[j7]
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Yunho Kim, Shin Hong:
Learning-based mutant reduction using fine-grained mutation operators. Softw. Test. Verification Reliab. 32(7) (2022)
[j6]
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Jinhan Kim, Juyoung Jeon, Shin Hong, Shin Yoo:
Predictive Mutation Analysis via the Natural Language Channel in Source Code. ACM Trans. Softw. Eng. Methodol. 31(4): 73:1-73:27 (2022)
[c18]
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Jeewoong Kim, Shin Hong:
Inferring Fine-grained Traceability Links between Javadoc Comment and JUnit Test Code. ICSME 2022: 424-428
[c17]
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Juyeon Yoon, Seungjoon Chung, Kihyuck Shin, Jinhan Kim, Shin Hong, Shin Yoo:
Repairing Fragile GUI Test Cases Using Word and Layout Embedding. ICST 2022: 291-301
[c16]
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Yunho Kim, Shin Hong:
Learning-based Mutant Reduction Using Fine-grained Mutation Operators. ICST 2022: 464
2021
[j5]
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Yunho Kim, Shin Hong:
DEMINER: test generation for high test coverage through mutant exploration. Softw. Test. Verification Reliab. 31(1-2) (2021)
[c15]
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Hanyoung Yoo, Jingun Hong, Lucas Bader, Dongwon Hwang, Shin Hong:
Improving Configurability of Unit-level Continuous Fuzzing: An Industrial Case Study with SAP HANA. ASE 2021: 1101-1105
[c14]
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Juyoung Jeon, Shin Hong:
Improving Mutation-Based Fault Localization with Plausible-code Generating Mutation Operators. ASE 2021: 1205-1207
[c13]
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  - conf/ssbse/HerlimHKK21
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Robert Sebastian Herlim, Shin Hong, Yunho Kim, Moonzoo Kim:
Empirical Study of Effectiveness of EvoSuite on the SBST 2020 Tool Competition Benchmark. SSBSE 2021: 121-135
[i1]
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  - journals/corr/abs-2104-10865
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Jinhan Kim, Juyoung Jeon, Shin Hong, Shin Yoo:
Predictive Mutation Analysis via Natural Language Channel in Source Code. CoRR abs/2104.10865 (2021)
2020
[c12]
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  - conf/icse/JeonH20
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Juyoung Jeon, Shin Hong:
Threats to validity in experimenting mutation-based fault localization. ICSE (NIER) 2020: 1-4
[c11]
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Shin Hong:
Using SMT Solver and Logic Puzzles for Teaching Computational Logics in Discrete Mathematics Class. SIGCSE 2020: 1381

2010 – 2019

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2019
[c10]
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  - conf/icst/LeeHYKKY19
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Seongmin Lee, Shin Hong, Jungbae Yi, Taeksu Kim, Chul-Joo Kim, Shin Yoo:
Classifying False Positive Static Checker Alarms in Continuous Integration Using Convolutional Neural Networks. ICST 2019: 391-401
[c9]
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Yunho Kim, Shin Hong, Moonzoo Kim:
Target-driven compositional concolic testing with function summary refinement for effective bug detection. ESEC/SIGSOFT FSE 2019: 16-26
2018
[c8]
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Yunho Kim, Shin Hong, Bongseok Ko, Duy Loc Phan, Moonzoo Kim:
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage. ICST 2018: 239-249
2017
[j4]
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Shin Hong, Taehoon Kwak, Byeongcheol Lee, Yiru Jeon, Bongseok Ko, Yunho Kim, Moonzoo Kim:
MUSEUM: Debugging real-world multilingual programs using mutation analysis. Inf. Softw. Technol. 82: 80-95 (2017)
2015
[j3]
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Shin Hong, Moonzoo Kim:
A survey of race bug detection techniques for multithreaded programmes. Softw. Test. Verification Reliab. 25(3): 191-217 (2015)
[j2]
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Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel:
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. Softw. Test. Verification Reliab. 25(4): 334-370 (2015)
[c7]
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  - conf/icse/ParkHKLC15
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Yongbae Park, Shin Hong, Moonzoo Kim, Dongju Lee, Junhee Cho:
Systematic Testing of Reactive Software with Non-Deterministic Events: A Case Study on LG Electric Oven. ICSE (2) 2015: 29-38
[c6]
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Shin Hong, Byeongcheol Lee, Taehoon Kwak, Yiru Jeon, Bongsuk Ko, Yunho Kim, Moonzoo Kim:
Mutation-Based Fault Localization for Real-World Multilingual Programs (T). ASE 2015: 464-475
2014
[c5]
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Shin Hong, Yongbae Park, Moonzoo Kim:
Detecting Concurrency Errors in Client-Side Java Script Web Applications. ICST 2014: 61-70
2013
[j1]
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  - journals/jss/HongK13
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Shin Hong, Moonzoo Kim:
Effective pattern-driven concurrency bug detection for operating systems. J. Syst. Softw. 86(2): 377-388 (2013)
[c4]
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Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel:
The Impact of Concurrent Coverage Metrics on Testing Effectiveness. ICST 2013: 232-241
2012
[c3]
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  - conf/issta/StaatsHKR12
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Matt Staats, Shin Hong, Moonzoo Kim, Gregg Rothermel:
Understanding user understanding: determining correctness of generated program invariants. ISSTA 2012: 188-198
[c2]
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Shin Hong, Jaemin Ahn, Sangmin Park, Moonzoo Kim, Mary Jean Harrold:
Testing concurrent programs to achieve high synchronization coverage. ISSTA 2012: 210-220

2000 – 2009

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2009
[c1]
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  - journals/entcs/KimHHK09
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Moonzoo Kim, Shin Hong, Changki Hong, Taeho Kim:
Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay. MBT@ETAPS 2009: 21-36

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