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Lee Barford
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2020 – today
- 2021
- [j13]Lee Barford
:
Material Value Ethics in a Model Process for Values-Based Design. IEEE Technol. Soc. Mag. 40(3): 42-49 (2021) - 2020
- [j12]Luca De Vito
A Compressive Sampling-Based Channel Estimation Method for Network Visibility Instrumentation. IEEE Trans. Instrum. Meas. 69(5): 2335-2344 (2020) - [j11]Yaesop Lee
Passive-Active Flowgraphs for Efficient Modeling and Design of Signal Processing Systems. J. Signal Process. Syst. 92(10): 1133-1151 (2020)
2010 – 2019
- 2019
- [j10]Yanzhou Liu
Optimized implementation of digital signal processing applications with gapless data acquisition. EURASIP J. Adv. Signal Process. 2019: 19 (2019) - [c15]Luca De Vito
Wireline channel estimation by compressive sampling for physical layer testing. I2MTC 2019: 1-5 - [c14]Lee Barford:
Contemporary Virtue Ethics and the Engineers of Autonomous Systems. ISTAS 2019: 1-7 - 2018
- [c13]Yanzhou Liu, Lee Barford, Shuvra S. Bhattacharyya:
Generalized Graph Connections for Dataflow Modeling of DSP Applications. SiPS 2018: 275-280 - 2017
- [j9]Lee Barford, Shuvra S. Bhattacharyya
Data Flow Algorithms for Processors with Vector Extensions - Handling Actors With Internal State. J. Signal Process. Syst. 87(1): 21-31 (2017) - [c12]Markus Mirz
Measurement-based parameter identification of non-linear polynomial frequency domain model of single-phase four diode bridge rectifier. I2MTC 2017: 1-6 - 2016
- [c11]Yanzhou Liu, Lee Barford, Shuvra S. Bhattacharyya:
Jitter measurement on deep waveforms with constant memory. I2MTC 2016: 1-6 - [c10]Yuanwei Fang, Andrew A. Chien, Andrew Lehane, Lee Barford:
Performance of parallel prefix circuit transition localization of pulsed waveforms. I2MTC 2016: 1-6 - [c9]Robert Uhl
Non-linear behavioral X-Parameters model of single-phase rectifier in the frequency domain. IECON 2016: 6292-6297 - [c8]Eric Klukovich, Mehmet Hadi Gunes, Lee Barford, Frederick C. Harris Jr.:
Accelerating BFS shortest paths calculations using CUDA for Internet topology measurements. HPCS 2016: 66-73 - 2015
- [j8]Lee Barford:
Software in measurement and measurement in software [Life after Graduation]. IEEE Instrum. Meas. Mag. 18(3): 40-41 (2015) - [c7]Yanzhou Liu, Lee Barford, Shuvra S. Bhattacharyya
Constant-rate clock recovery and jitter measurement on deep memory waveforms using dataflow. I2MTC 2015: 1590-1595 - 2014
- [j7]Kurt Barbé
A Guaranteed Blind and Automatic Probability Density Estimation of Raw Measurements. IEEE Trans. Instrum. Meas. 63(9): 2120-2128 (2014) - [c6]Lee Barford, Shuvra S. Bhattacharyya
Data flow algorithms for processors with vector extensions: Handling actors with internal state. GlobalSIP 2014: 20-24 - [c5]Lee Barford, Kristen Keenan:
Segmenting a signal based on a local property using multicore processors. I2MTC 2014: 397-401 - 2013
- [c4]Kurt Barbé
Eliminating user-interaction in probability density estimation. I2MTC 2013: 1295-1300 - [c3]Torbjorn Loken, Lee Barford, Frederick C. Harris Jr.:
Massively parallel jitter measurement from deep memory digital waveforms. I2MTC 2013: 1744-1749 - 2011
- [j6]Lee Barford:
Speeding Localization of Pulsed Signal Transitions Using Multicore Processors. IEEE Trans. Instrum. Meas. 60(5): 1588-1593 (2011) - [p1]Lee Barford:
Model-Based Testing of Analog Embedded Systems Components. Model-Based Testing for Embedded Systems 2011 - 2010
- [c2]Roberto Lopez-Hernandez, David Guilmaine, Michael J. McGuffin, Lee Barford:
A layer-oriented interface for visualizing time-series data from oscilloscopes. PacificVis 2010: 41-48
2000 – 2009
- 2008
- [j5]Lee Barford:
Filtering of Randomly Sampled Time-Stamped Measurements. IEEE Trans. Instrum. Meas. 57(2): 222-227 (2008) - [j4]Lee Barford:
Fourier Analysis of Time-Stamped Signals Using a Small Number of Samples. IEEE Trans. Instrum. Meas. 57(5): 884-890 (2008) - 2007
- [j3]Lee Barford, Jeff Burch:
Fourier Analysis From Networked Measurements Using Time Synchronization. IEEE Trans. Instrum. Meas. 56(5): 1601-1604 (2007) - 2006
- [c1]Lee Barford:
Diagnosis and Design for Diagnosability for Internet Routers. ISQED 2006: 761-768 - 2004
- [j2]Lee Barford:
Sequential Bayesian bit error rate measurement. IEEE Trans. Instrum. Meas. 53(4): 947-954 (2004)
1990 – 1999
- 1995
- [j1]Daniel Kuokka, Stanley Jefferson, Lee Barford, Felix Frayman:
A parametric design assistant for concurrent engineering. Artif. Intell. Eng. Des. Anal. Manuf. 9(2): 135-144 (1995)
Coauthor Index
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