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Lampros Leontaris
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2020 – today
- 2023
- [j5]Lampros Leontaris, Andreana Mitsiaki, Paschalis Charalampous, Nikolaos Dimitriou, Eleni Leivaditou, Aristoklis Karamanidis, George Margetis, Konstantinos C. Apostolakis, Sebastián Pantoja, Constantine Stephanidis, Dimitrios Tzovaras, Elpiniki Papageorgiou:
A blockchain-enabled deep residual architecture for accountable, in-situ quality control in industry 4.0 with minimal latency. Comput. Ind. 149: 103919 (2023) - [j4]Apostolos Evangelidis, Nikolaos Dimitriou, Lampros Leontaris, Dimosthenis Ioannidis, Gregory Tinker, Dimitrios Tzovaras:
A Deep Regression Framework Toward Laboratory Accuracy in the Shop Floor of Microelectronics. IEEE Trans. Ind. Informatics 19(3): 2652-2661 (2023) - 2022
- [d1]Apostolos Evangelidis, Nikolaos Dimitriou, Lampros Leontaris, Dimosthenis Ioannidis, Gregory Tinker, Dimitrios Tzovaras:
PCB 3D inspection from 2D images. IEEE DataPort, 2022 - 2021
- [j3]Lampros Leontaris, Nikolaos Dimitriou, Dimosthenis Ioannidis, Konstantinos Votis, Dimitrios Tzovaras, Elpiniki Papageorgiou:
An Autonomous Illumination System for Vehicle Documentation Based on Deep Reinforcement Learning. IEEE Access 9: 75336-75348 (2021) - 2020
- [j2]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
A Deep Learning framework for simulation and defect prediction applied in microelectronics. Simul. Model. Pract. Theory 100: 102063 (2020) - [j1]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans. IEEE Trans. Ind. Electron. 67(7): 5748-5757 (2020) - [i2]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans. CoRR abs/2002.10974 (2020) - [i1]Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics. CoRR abs/2002.10986 (2020)
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