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Francis Rivai
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2010 – 2019
- 2018
- [j6]Pik Kee Tan, Yuzhe Zhao, Francis Rivai, Binghai Liu, Yanlin Pan, Ran He, Hao Tan, Zhihong Mai:
Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique. Microelectron. Reliab. 88-90: 309-314 (2018) - 2017
- [j5]Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Soh Ping Neo, Dayanand Nagalingam, Kim Hong Yip, Jeffery Lam, Zhihong Mai:
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern. Microelectron. Reliab. 76-77: 141-144 (2017) - [j4]Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Hui Peng Ng, Alfred C. T. Quah, Angela Teo, Jeffery Lam, Zhihong Mai:
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. Microelectron. Reliab. 76-77: 261-266 (2017) - 2016
- [j3]Changqing Chen, P. T. Ng, Ghinboon Ang, H. Tan, Francis Rivai, Y. Z. Ma, Huipeng Ng, Jeffrey Lam, Zhihong Mai:
Electrical analysis on implantation-related defect by nanoprobing methodology. Microelectron. Reliab. 64: 317-320 (2016) - [j2]Pik Kee Tan, Huei Hao Yap, Changqing Chen, Francis Rivai, Yuzhe Zhao, Lei Zhu, Hua Feng, Hao Tan, Ran He, D. D. Wang, Y. M. Huang, Yin Zhe Ma, Jeffrey Lam, Zhi Hong Mai:
Cross-sectional nanoprobing fault isolation technique on submicron devices. Microelectron. Reliab. 64: 321-325 (2016) - [j1]Yuzhe Zhao
, Q. J. Wang, Pik Kee Tan, Huei Hao Yap, Binghai Liu, H. Feng, Hao Tan, Ran He, Y. M. Huang, D. D. Wang, Lei Zhu, C. Q. Chen, Francis Rivai, Jeffrey Lam, Zhihong Mai:
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. Microelectron. Reliab. 64: 362-366 (2016)
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