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Hiroyuki Fujimoto
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2010 – 2019
- 2019
- [c1]Hiroyuki Fujimoto, Junya Morimoto, Takuya Hayashi, Junji Yamato
, Hiroyuki Ishii, Jun Ohya, Atsuo Takanishi:
Pattern and frontier-based, efficient and effective exploration of autonomous mobile robots in unknown environments. Autonomous Vehicles and Machines 2019: 1-7 - 2017
- [j11]Kazuya Matsuzaki
A Study of Mechanism of Bi-Directional Measurement Influenced by Material on Dimensional Measurement Using X-Ray CT. Int. J. Autom. Technol. 11(5): 707-715 (2017) - [j10]Atsushi Waseda
Uniformity Evaluation of Lattice Spacing of 28Si Single Crystals. IEEE Trans. Instrum. Meas. 66(6): 1304-1308 (2017) - 2015
- [j9]Lin Xue, Hiromasa Suzuki, Yutaka Ohtake, Hiroyuki Fujimoto
A method for improving measurement accuracy of cylinders in dimensional CT metrology. Comput. Aided Des. 69: 25-34 (2015) - [j8]Osamu Sato, Hiroyuki Fujimoto, Sonko Osawa, Makoto Abe, Toshiyuki Takatsuji:
Simple Interim Check of Measuring Performance for X-Ray Computed Tomography Used as Coordinate Measuring System. Int. J. Autom. Technol. 9(5): 525-529 (2015) - [j7]Hiroyuki Fujimoto, Makoto Abe, Sonko Osawa, Osamu Sato, Toshiyuki Takatsuji:
Development of Dimensional X-Ray Computed Tomography. Int. J. Autom. Technol. 9(5): 567-571 (2015) - [j6]Lin Xue, Hiromasa Suzuki, Yutaka Ohtake, Hiroyuki Fujimoto
Numerical Analysis of the Feldkamp-Davis-Kress Effect on Industrial X-Ray Computed Tomography for Dimensional Metrology. J. Comput. Inf. Sci. Eng. 15(2) (2015) - [j5]Atsushi Waseda
Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals. IEEE Trans. Instrum. Meas. 64(6): 1692-1695 (2015) - 2011
- [j4]Hiroyuki Fujimoto, Atsushi Waseda, Xiao-Wei Zhang:
Profile Measurement of Polished Surface with Respect to a Lattice Plane of a Silicon Crystal Using a Self-Referenced Lattice Comparator. Int. J. Autom. Technol. 5(2): 179-184 (2011)
2000 – 2009
- 2007
- [j3]Hiroyuki Fujimoto, Giovanni Mana, Kan Nakayama:
A Universal Geometry for Calculable Frequency-Response Coefficient of LCR Standards and New 10-MHz Resistance and 1.6-MHz Quadrature-Bridge Systems. IEEE Trans. Instrum. Meas. 56(2): 221-225 (2007) - [j2]Hiroyuki Fujimoto, Giovanni Mana
A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter. IEEE Trans. Instrum. Meas. 56(2): 351-355 (2007) - 2001
- [j1]Kan Nakayama, Hiroyuki Fujimoto, Tetsuya Ishikawa, Hiroshi Takeno:
Silicon molar volume discrepancy: studies of the NRLM crystal. IEEE Trans. Instrum. Meas. 50(2): 601-603 (2001)
Coauthor Index
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