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Marco Barbato
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2010 – 2019
- 2018
- [j11]Marco Buonomo, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester:
Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique. Microelectron. Reliab. 88-90: 878-881 (2018) - 2017
- [j10]Isabella Rossetto, Matteo Meneghini, Eleonora Canato, Marco Barbato, Steve Stoffels, Niels Posthuma, Stefaan Decoutere, Andrea Natale Tallarico, Gaudenzio Meneghesso, Enrico Zanoni:
Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level. Microelectron. Reliab. 76-77: 298-303 (2017) - [j9]M. Silvestrini, Marco Barbato, Sonia Costantini, L. Castoldi, Federico Vercesi, Luigi Zanotti, Gaudenzio Meneghesso:
Long-term stresses on linear micromirrors for pico projector application. Microelectron. Reliab. 76-77: 626-630 (2017) - 2016
- [c3]Roberto Fierimonte, Marco Barbato, Antonello Rosato, Massimo Panella:
Distributed learning of Random Weights Fuzzy Neural Networks. FUZZ-IEEE 2016: 2287-2294 - 2015
- [j8]Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs:
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells. Microelectron. Reliab. 55(9-10): 1795-1799 (2015) - [c2]Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, D. Tonini, A. Voltan, Giorgio Cellere:
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. IRPS 2015: 3 - 2014
- [j7]Matteo Meneghini, Simone Vaccari, Matteo Dal Lago, Stefano Marconi, Marco Barbato, Nicola Trivellin, Alessio Griffoni, Alberto Alfier, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni:
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. Microelectron. Reliab. 54(6-7): 1143-1149 (2014) - [j6]Matteo Dal Lago, Matteo Meneghini, Carlo De Santi, Marco Barbato, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni:
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms. Microelectron. Reliab. 54(9-10): 2138-2141 (2014) - [c1]Marco Barbato, Andrea Cester, Viviana Mulloni, Benno Margesin, Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso:
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures. ESSDERC 2014: 70-73 - 2013
- [j5]Simone Vaccari, Matteo Meneghini, Alessio Griffoni, Diego Barbisan, Marco Barbato, S. Carraro, Marco La Grassa, Gaudenzio Meneghesso, Enrico Zanoni:
ESD characterization of multi-chip RGB LEDs. Microelectron. Reliab. 53(9-11): 1510-1513 (2013) - [j4]Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso:
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53(9-11): 1809-1813 (2013) - 2012
- [j3]Giorgio De Pasquale, Marco Barbato, Valentina Giliberto, Gaudenzio Meneghesso, Aurelio Somà:
Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation. Microelectron. Reliab. 52(9-10): 1808-1811 (2012) - 2011
- [j2]A. Massenz, Marco Barbato, Valentina Giliberto, Benno Margesin, S. Colpo, Gaudenzio Meneghesso:
Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test. Microelectron. Reliab. 51(9-11): 1887-1891 (2011) - 2010
- [j1]Augusto Tazzoli, Marco Barbato, F. Mattiuzzo, V. Ritrovato, Gaudenzio Meneghesso:
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches. Microelectron. Reliab. 50(9-11): 1604-1608 (2010)
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