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Ketul Sutaria
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2020 – today
- 2022
- [c11]Ketul B. Sutaria, Minki Cho, Anisur Rahman, Jihan Standfest, Rahul Sharma, Swaroop Kumar Namalapuri, Shiv Gupta, Bahar Ajdari, Ricardo Ascázubi, Balkaran Gill:
Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform. IRPS 2022: 1-6 - 2020
- [c10]Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks:
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. IRPS 2020: 1-5
2010 – 2019
- 2018
- [c9]Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey:
Transistor reliability characterization and modeling of the 22FFL FinFET technology. IRPS 2018: 6 - 2017
- [j2]Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao:
RTN in Scaled Transistors for On-Chip Random Seed Generation. IEEE Trans. Very Large Scale Integr. Syst. 25(8): 2248-2257 (2017) - 2015
- [c8]Ketul B. Sutaria, Pengpeng Ren, Abinash Mohanty, Xixiang Feng, Runsheng Wang, Ru Huang, Yu Cao:
Duty cycle shift under static/dynamic aging in 28nm HK-MG technology. IRPS 2015: 7 - 2014
- [j1]Yu Cao, Jyothi Velamala, Ketul Sutaria, Mike Shuo-Wei Chen, Jonathan Ahlbin, Ivan Sanchez Esqueda, Michael Bajura, Michael Fritze:
Cross-Layer Modeling and Simulation of Circuit Reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(1): 8-23 (2014) - [c7]Ketul Sutaria, Athul Ramkumar, Rongjun Zhu, Renju Rajveev, Yao Ma, Yu Cao:
BTI-Induced Aging under Random Stress Waveforms: Modeling, Simulation and Silicon Validation. DAC 2014: 203:1-203:6 - [c6]Ketul Sutaria, Athul Ramkumar, Rongjun Zhu, Yu Cao:
Where is the Achilles Heel under Circuit Aging. ISVLSI 2014: 278-279 - 2013
- [c5]Zihan Xu, Ketul Sutaria, Chengen Yang, Chaitali Chakrabarti, Yu Cao:
Compact modeling of STT-MTJ for SPICE simulation. ESSDERC 2013: 338-341 - 2012
- [c4]Jyothi Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao:
Statistical aging under dynamic voltage scaling: A logarithmic model approach. CICC 2012: 1-4 - [c3]Jyothi Bhaskarr Velamala, Ketul Sutaria, Takashi Sato, Yu Cao:
Physics matters: statistical aging prediction under trapping/detrapping. DAC 2012: 139-144 - [c2]Zihan Xu, Ketul Sutaria, Chengen Yang, Chaitali Chakrabarti, Yu Cao:
Hierarchical modeling of Phase Change memory for reliable design. ICCD 2012: 115-120 - [c1]Yunus Emre, Chengen Yang, Ketul Sutaria, Yu Cao, Chaitali Chakrabarti:
Enhancing the Reliability of STT-RAM through Circuit and System Level Techniques. SiPS 2012: 125-130
Coauthor Index
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