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Peter Jacob
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2020 – today
- 2021
- [j17]Zeinab Mahmoudi
, Simone Del Favero
Toward an Optimal Definition of Hypoglycemia with Continuous Glucose Monitoring. Comput. Methods Programs Biomed. 209: 106303 (2021)
2010 – 2019
- 2017
- [j16]Peter Jacob, Roman Furrer
A very unusual transistor failure, caused by a solenoid. Microelectron. Reliab. 76-77: 102-105 (2017) - [j15]Peter Jacob, Uwe Thiemann:
New ESD challenges in RFID manufacturing. Microelectron. Reliab. 76-77: 395-399 (2017) - 2016
- [j14]Peter Jacob:
Early life field failures in modern automotive electronics - An overview; root causes and precautions. Microelectron. Reliab. 64: 79-83 (2016) - [j13]Peter Jacob:
Failure mechanisms and precautions in plug connectors and relays. Microelectron. Reliab. 64: 693-698 (2016) - 2015
- [j12]Peter Jacob:
Unusual defects, generated by wafer sawing: An update, including pick&place processing. Microelectron. Reliab. 55(9-10): 1826-1831 (2015) - [j11]Peter Jacob:
Failure analysis and reliability on system level. Microelectron. Reliab. 55(9-10): 2154-2158 (2015) - 2013
- [j10]Peter Jacob, Giovanni Nicoletti:
Failure causes generating aluminium protrusion/extrusion. Microelectron. Reliab. 53(9-11): 1553-1557 (2013) - 2011
- [j9]Jochen Schuld, Thilo Schäfer, Stefan Nickel, Peter Jacob, Martin K. Schilling, Sven Richter:
Impact of IT-supported clinical pathways on medical staff satisfaction. A prospective longitudinal cohort study. Int. J. Medical Informatics 80(3): 151-156 (2011) - [j8]Peter Jacob:
From component to system failure analysis - The future challenge within work-sharing supply chains. Microelectron. Reliab. 51(9-11): 1618-1623 (2011)
2000 – 2009
- 2009
- [j7]Peter Jacob, Willy Knecht, Albert Kunz, Giovanni Nicoletti, Thomas Lautenschlager, Moreno Mondada, Damien Pachoud:
Reading distance degradation mechanisms of near-field RFID devices. Microelectron. Reliab. 49(9-11): 1288-1292 (2009) - 2008
- [j6]Peter Jacob, Werner Rothkirch:
Unusual defects, generated by wafer sawing: Diagnosis, mechanisms and how to distinguish from related failures. Microelectron. Reliab. 48(8-9): 1253-1257 (2008) - [j5]Peter Jacob:
Surface ESD (ESDFOS) in assembly fab machineries as a functional and reliability risk - Failure analysis, tool diagnosis and on-site-remedies. Microelectron. Reliab. 48(8-9): 1608-1612 (2008) - 2007
- [j4]Peter Jacob, Giovanni Nicoletti, Florian Hauf:
Device decapsulated (and/or depassivated) - Retest ok - What happened? Microelectron. Reliab. 47(9-11): 1574-1579 (2007) - 2006
- [j3]Peter Jacob, Albert Kunz, Giovanni Nicoletti:
Reliability and wearout characterisation of LEDs. Microelectron. Reliab. 46(9-11): 1711-1714 (2006) - 2005
- [j2]Peter Jacob, Uwe Thiemann, Joachim C. Reiner:
Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. Microelectron. Reliab. 45(7-8): 1174-1180 (2005) - 2004
- [j1]Peter Jacob, Joachim C. Reiner:
Electrostatic Effects on Semiconductor Tools. Microelectron. Reliab. 44(9-11): 1787-1792 (2004)
Coauthor Index
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