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Francisco André Corrêa Alegria
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2020 – today
- 2024
- [j24]Francisco André Corrêa Alegria:
Expanding the IEEE 1057 Standard Jitter Test of Waveform Recorders to Include Simultaneous Voltage Noise Estimation. IEEE Access 12: 103018-103025 (2024) - [j23]F. Corrêa Alegria:
Uncertainty of the initial phase estimation of a sinewave in the presence of phase noise, additive noise or jitter. J. Frankl. Inst. 361(15): 107116 (2024) - [j22]Lian Xie, Prashanth Baskaran, Artur Lopes Ribeiro, Francisco André Corrêa Alegria, Helena Maria Geirinhas Ramos:
Classification of Corrosion Severity in SPCC Steels Using Eddy Current Testing and Supervised Machine Learning Models. Sensors 24(7): 2259 (2024) - [j21]Francisco André Corrêa Alegria, Lian Xie, Dario Jeronimo Pasadas:
Study of the Bias of the Initial Phase Estimation of a Sinewave of Known Frequency in the Presence of Phase Noise. Sensors 24(12): 3730 (2024)
2010 – 2019
- 2012
- [j20]F. Corrêa Alegria:
Precision of harmonic amplitude estimation on jitter corrupted data using sine fitting. Signal Process. 92(3): 807-818 (2012) - [j19]Francisco André Corrêa Alegria, Hugo Plácido da Silva:
Choosing Between Terminal and Independently Based Gain and Offset Error in the ADC Histogram Test. IEEE Trans. Instrum. Meas. 61(1): 9-16 (2012) - 2010
- [j18]A. Lopes Ribeiro, Francisco André Corrêa Alegria, Octavian Adrian Postolache, Helena Maria Geirinhas Ramos:
Liftoff Correction Based on the Spatial Spectral Behavior of Eddy-Current Images. IEEE Trans. Instrum. Meas. 59(5): 1362-1367 (2010) - [j17]F. Corrêa Alegria, A. Cruz Serra:
Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting. IEEE Trans. Instrum. Meas. 59(9): 2328-2333 (2010) - [j16]Ricardo Queirós, Francisco André Corrêa Alegria, Pedro Silva Girão, António Manuel da Cruz Serra:
Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging. IEEE Trans. Instrum. Meas. 59(12): 3227-3236 (2010)
2000 – 2009
- 2009
- [j15]F. Corrêa Alegria, A. Cruz Serra:
Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method. IEEE Trans. Instrum. Meas. 58(3): 512-521 (2009) - [j14]Shahram Shariat-Panahi, Francisco André Corrêa Alegria, Antoni Mánuel Lázaro, António Manuel da Cruz Serra:
IEEE 1057 Jitter Test of Waveform Recorders. IEEE Trans. Instrum. Meas. 58(7): 2234-2244 (2009) - [j13]F. Corrêa Alegria, A. Cruz Serra:
The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise. IEEE Trans. Instrum. Meas. 58(11): 3847-3854 (2009) - 2008
- [j12]F. Corrêa Alegria, Francisco Antonio Martins Travassos:
Implementation Details of an Automatic Monitoring System Used on a Vodafone Radiocommunication Base Station. Eng. Lett. 16(4): 529-536 (2008) - 2007
- [j11]F. Corrêa Alegria, A. Cruz Serra:
Standard Histogram Test Precision of ADC Gain and Offset Error Estimation. IEEE Trans. Instrum. Meas. 56(5): 1527-1531 (2007) - [c1]Leonel Sousa, Francisco André Corrêa Alegria, José A. Germano:
Developing and Integrating Lab Projects as Important Learning Components in an Embedded Systems Course. MSE 2007: 113-114 - 2006
- [j10]F. Corrêa Alegria, A. Cruz Serra:
ADC transfer curve types - A review. Comput. Stand. Interfaces 28(5): 553-559 (2006) - 2005
- [j9]Francisco André Corrêa Alegria, Antonio Moschitta, Paolo Carbone, António Manuel da Cruz Serra, Dario Petri:
Effective ADC linearity testing using sinewaves. IEEE Trans. Circuits Syst. I Regul. Pap. 52-I(7): 1267-1275 (2005) - [j8]Francisco André Corrêa Alegria, António Manuel da Cruz Serra:
Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test. IEEE Trans. Instrum. Meas. 54(1): 110-116 (2005) - [j7]Francisco André Corrêa Alegria, António Manuel da Cruz Serra:
Overdrive in the ramp histogram test of ADCs. IEEE Trans. Instrum. Meas. 54(6): 2305-2309 (2005) - 2004
- [j6]A. Cruz Serra, F. Corrêa Alegria, Raul Carneiro Martins, Manuel Fonseca da Silva:
Analog-to-digital converter testing - new proposals. Comput. Stand. Interfaces 26(1): 3-13 (2004) - [j5]Francisco André Corrêa Alegria, Pedro Silva Girão, Vladimír Haasz, A. Cruz Serra:
Performance of data acquisition systems from the user's point of view. IEEE Trans. Instrum. Meas. 53(4): 907-914 (2004) - 2003
- [j4]Francisco André Corrêa Alegria, António Manuel da Cruz Serra:
Variance of the cumulative histogram of ADCs due to frequency errors. IEEE Trans. Instrum. Meas. 52(1): 69-74 (2003) - 2002
- [j3]Francisco André Corrêa Alegria, Pasquale Arpaia, António Manuel da Cruz Serra, Pasquale Daponte:
Performance analysis of an ADC histogram test using small triangular waves. IEEE Trans. Instrum. Meas. 51(4): 723-729 (2002) - 2001
- [j2]Francisco André Corrêa Alegria, António Manuel da Cruz Serra:
Influence of frequency errors in the variance of the cumulative histogram [in ADC testing]. IEEE Trans. Instrum. Meas. 50(2): 461-464 (2001) - 2000
- [j1]Francisco André Corrêa Alegria, António Manuel da Cruz Serra:
Automatic calibration of analog and digital measuring instruments using computer vision. IEEE Trans. Instrum. Meas. 49(1): 94-99 (2000)
Coauthor Index
aka: António Manuel da Cruz Serra
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