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Oliver Hilt
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2020 – today
- 2021
- [c3]Oliver Hilt
, Frank Brunner, Eldad Bahat-Treidel, Mihaela Wolf, Joachim Würfl:
GaN-channel HEMTs with AlN buffer for high-voltage switching. DRC 2021: 1-2 - 2020
- [c2]Eldad Bahat-Treidel
The influence of the gate trench orientation to the crystal plane on the conduction properties of vertical GaN MISFETs for laser driving applications. DRC 2020: 1-2
2010 – 2019
- 2016
- [j6]Matteo Meneghini
Normally-off GaN-HEMTs with p-type gate: Off-state degradation, forward gate stress and ESD failure. Microelectron. Reliab. 58: 177-184 (2016) - [j5]Eldad Bahat-Treidel, Oliver Hilt
Temperature dependent dynamic on-state resistance in GaN-on-Si based normally-off HFETs. Microelectron. Reliab. 64: 556-559 (2016) - 2015
- [j4]Clément Fleury
High temperature performances of normally-off p-GaN gate AlGaN/GaN HEMTs on SiC and Si substrates for power applications. Microelectron. Reliab. 55(9-10): 1687-1691 (2015) - [c1]Mattia Capriotti, Clément Fleury
E-mode AlGaN/GaN True-MOS, with high-k ZrO2 gate insulator. ESSDERC 2015: 60-63 - 2013
- [j3]Clément Fleury
Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications. Microelectron. Reliab. 53(9-11): 1444-1449 (2013) - 2012
- [j2]Alberto Zanandrea, Eldad Bahat-Treidel, Fabiana Rampazzo, Antonio Stocco, Matteo Meneghini
Single- and double-heterostructure GaN-HEMTs devices for power switching applications. Microelectron. Reliab. 52(9-10): 2426-2430 (2012) - 2011
- [j1]Joachim Würfl, Eldad Bahat-Treidel, Frank Brunner, E. Cho, Oliver Hilt
Reliability issues of GaN based high voltage power devices. Microelectron. Reliab. 51(9-11): 1710-1716 (2011)
Coauthor Index
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