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27th ETS 2022: Barcelona, Spain
- IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. IEEE 2022, ISBN 978-1-6654-6706-3
- Rezgar Sadeghi, Ehsan Akbari, Mohamad Ali Saber:
On-Chip Training of Crosstalk Predictors to Fit Uncertainties. 1-2 - S. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel
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A Lightweight, Plug-and-Play and Autonomous JTAG Authentication IP for Secure Device Testing. 1-4 - Alban Haynse Immanuel, Jeyendran Nithyanadam:
WLAN Rx PER Test Implementation in ATE. 1-4 - Likith Kumar Manchukonda, Karthikeyan Natarajan, Manish Arora:
Power Aware Test. 1 - Nooshin Nosrati, Seyedeh Maryam Ghasemi, Mahboobe Sadeghipour Roodsari, Zainalabedin Navabi:
Concurrent Error Detection for LSTM Accelerators. 1-2 - Jiebing Wu, Yongsheng Sun, Yuan Wang, Yukai Lin, Mingna Fan, Junlin Huang:
Research on Path Delay with BTI Recovery Effect. 1-4 - Troya Çagil Köylü, Said Hamdioui, Mottaqiallah Taouil:
Smart Redundancy Schemes for ANNs Against Fault Attacks. 1-2 - Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann:
Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators. 1-6 - Nadun Sinhabahu, Jian-De Li, Katherine Shu-Min Li, Sying-Jyan Wang
Trojan Insertions of Fully Programmable Valve Arrays. 1-2 - Francesco Angione
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. 1-10 - Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. 1-2 - Riccardo Cantoro, Francesco Garau, Patrick Girard, Nima Kolahimahmoudi
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. 1-2 - Francesco Angione
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. 1-6 - Jonti Talukdar
TaintLock: Preventing IP Theft through Lightweight Dynamic Scan Encryption using Taint Bits*. 1-6 - Mohamed Thouabtia, Alexander Stephan Oleszczuk, Thomas Girg, Martin Allinger:
Novel Method to Measure Common Mode Transient Immunity of Isolators. 1-2 - Sergio Vinagrero Gutierrez:
Memristor-based security primitives. 1-2 - Hongfei Wang, Zhanfei Wu, Wei Liu:
CNN-based Data-Model Co-Design for Efficient Test-termination Prediction. 1-6 - Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak:
X-Masking for In-System Deterministic Test. 1-6 - Zhe Zhang, Jan Lappas, André Lucas Chinazzo, Christian Weis, Zhihang Wu, Leibin Ni
Machine learning based soft error rate estimation of pass transistor logic in high-speed communication. 1-4 - Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui:
RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs). 1-2 - Parvez Anwar Chanawala, Ian Hill
Prediction of Thermally Accelerated Aging Process at 28nm. 1-2 - Hussam Amrouch, Krishnendu Chakrabarty, Dirk Pflüger, Ilia Polian, Matthias Sauer, Matteo Sonza Reorda
Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization. 1-6 - Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu:
On-Line Reliability Estimation of Ring Oscillator PUF. 1-2 - Katharina Ruep, Daniel Große:
SpinalFuzz: Coverage-Guided Fuzzing for SpinalHDL Designs. 1-4 - Soyed Tuhin Ahmed
Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric. 1-2 - Gyohun Jeong, Sangmin Kim, Hyelyun Kim, Sunghee Lee:
A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage. 1-2 - Florian Neugebauer, Stefan Holst, Ilia Polian:
On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks. 1-6 - Arunkumar Vijayan, Mehdi B. Tahoori, Ewald Kintzli, Timm Lohmann, Juergen Hans Handl:
A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems. 1-4 - Andrew Dobis
Enabling Coverage-Based Verification in Chisel. 1-6 - Moritz Fieback
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. 1-6 - Jayeeta Chaudhuri, Krishnendu Chakrabarty:
Detection of Malicious FPGA Bitstreams using CNN-Based Learning. 1-2 - Vahid Eftekhari Moghadam, Paolo Prinetto, Gianluca Roascio:
Real-Time Control-Flow Integrity for Multicore Mixed-Criticality IoT Systems. 1-4 - Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich:
On Extracting Reliability Information from Speed Binning. 1-4 - Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann:
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. 1-6 - Lucas Matana Luza, Frederic Wrobel
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices. 1-10 - Alexander Stephan Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, Robert Weigel:
Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices. 1-2 - J. Lefevre, P. Debaud, Patrick Girard
A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors. 1-2 - Marcel Merten, Sebastian Huhn, Rolf Drechsler
Quality Assessment of RFET-based Logic Locking Protection Mechanisms using Formal Methods. 1-2 - Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Sk Subidh Ali:
Evaluating Security of New Locking SIB-based Architectures. 1-6 - William R. Eisenstadt
Special Session on RF/5G Test. 1-9 - Michail Moraitis
FPGA Design Deobfuscation by Iterative LUT Modifications at Bitstream Level. 1-2 - Guilherme Cardoso Medeiros, Moritz Fieback
Hierarchical Memory Diagnosis. 1-2 - Johanna Sepúlveda, Dominik Winkler:
Super Acceleration of Dilithium in MPSoCs Critical Environments. 1-4 - Vladimir A. Zivkovic, Michele Palazzi, Ming Chuen Alvan Lam, Mogens Isager:
AMS Test Vector Generation using AMS Verification and IEEE P1687.2. 1-4
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