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"EM Algorithm for One-Shot Device Testing With Competing Risks Under ..."

Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling (2016)

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DOI: 10.1109/TR.2015.2500361

access: closed

type: Journal Article

metadata version: 2020-07-09

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Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling:
EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution. IEEE Trans. Reliab. 65(2): 973-991 (2016)

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