default search action
"Simultaneous Measurement of Thickness and Group Refractive Index Based on ..."
Xu Lu et al. (2023)
- Xu Lu, Xinkai Wang, Yunlong Zhu, Yonggui Yuan, Fanyang Dang, Yao Zhu, Zhangjun Yu, Jun Yang:
Simultaneous Measurement of Thickness and Group Refractive Index Based on Differential White Light Interferometry. IEEE Trans. Instrum. Meas. 72: 1-8 (2023)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.