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"Testable MUTEX Design."

Yang Zhang et al. (2016)

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DOI: 10.1109/TCSI.2016.2561906

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/tcas/ZhangHMZBCB16
Yang Zhang, Leandro S. Heck, Matheus T. Moreira, David Zar, Melvin A. Breuer, Ney Laert Vilar Calazans, Peter A. Beerel:
Testable MUTEX Design. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(8): 1188-1199 (2016)

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