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"FS-TRA: Evaluating Sequential Circuit Reliability via a Fanout-Source ..."

Jie Xiao, Zecheng Wu, Jungang Lou (2024)

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DOI: 10.1109/TCAD.2024.3410157

access: closed

type: Journal Article

metadata version: 2024-12-22

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Jie Xiao, Zecheng Wu, Jungang Lou:
FS-TRA: Evaluating Sequential Circuit Reliability via a Fanout-Source Tracking and Reduction Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(12): 4726-4739 (2024)

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