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"High-Quality Statistical Test Compression With Narrow ATE Interface."

Vasileios Tenentes, Xrysovalantis Kavousianos (2013)

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DOI: 10.1109/TCAD.2013.2256394

access: closed

type: Journal Article

metadata version: 2024-08-04

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Vasileios Tenentes, Xrysovalantis Kavousianos:
High-Quality Statistical Test Compression With Narrow ATE Interface. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(9): 1369-1382 (2013)

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