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"Functional Broadside Tests With Incompletely Specified Scan-In States."

Irith Pomeranz (2013)

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DOI: 10.1109/TCAD.2013.2261121

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Functional Broadside Tests With Incompletely Specified Scan-In States. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(9): 1445-1449 (2013)

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