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"Probabilistic Wire Resistance Degradation Due to Electromigration in Power ..."

Vivek Mishra, Sachin S. Sapatnekar (2017)

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DOI: 10.1109/TCAD.2016.2584054

access: closed

type: Journal Article

metadata version: 2020-09-24

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Vivek Mishra, Sachin S. Sapatnekar:
Probabilistic Wire Resistance Degradation Due to Electromigration in Power Grids. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(4): 628-640 (2017)

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