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"Delay prediction from resistance-capacitance models of general MOS circuits."

Denis Martin, Nicholas C. Rumin (1993)

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DOI: 10.1109/43.238036

access: closed

type: Journal Article

metadata version: 2020-09-24

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Denis Martin, Nicholas C. Rumin:
Delay prediction from resistance-capacitance models of general MOS circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(7): 997-1003 (1993)

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