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"Dependability evaluation of integrated circuits at design time against ..."

Huiyun Li, Hai Yuan (2012)

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DOI: 10.1002/SEC.327

access: closed

type: Journal Article

metadata version: 2020-09-10

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Huiyun Li, Hai Yuan:
Dependability evaluation of integrated circuits at design time against laser fault injection. Secur. Commun. Networks 5(5): 450-461 (2012)

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