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"Drop-shock reliability improvement of embedded chip resistor packages ..."

Se-Hoon Park et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.05.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Se-Hoon Park, Jong Chul Park, Jae-Yong Park, Young-Ho Kim:
Drop-shock reliability improvement of embedded chip resistor packages through via structure modification. Microelectron. Reliab. 63: 194-200 (2016)

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