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"Novel analysis model for investigation of contact force and scrub length ..."

De-Shin Liu et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.02.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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De-Shin Liu, Chi-Min Chang, John Liu, Shu-Ching Ho, Hao-Yin Tsai:
Novel analysis model for investigation of contact force and scrub length for design of probe card. Microelectron. Reliab. 50(6): 872-880 (2010)

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