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"Impact of wafer charging on hot carrier reliability and optimization of ..."

Didier Goguenheim et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.09.004

access: closed

type: Journal Article

metadata version: 2023-09-30

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Didier Goguenheim, Alain Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, Philippe Boivin:
Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectron. Reliab. 45(3-4): 487-492 (2005)

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