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"Mole Fraction and Device Reliability Analysis of ..."

Km Sucheta Singh, Satyendra Kumar (2024)

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DOI: 10.1142/S0218126624502128

access: closed

type: Journal Article

metadata version: 2025-01-19

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Km Sucheta Singh, Satyendra Kumar:
Mole Fraction and Device Reliability Analysis of Vertical-Tunneling-Attributed Dual-Material Double-Gate Heterojunction-TFET with Si0.7Ge0.3 Source Region at Device and Circuit Level. J. Circuits Syst. Comput. 33(12): 2450212:1-2450212:22 (2024)

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