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"Circuit reliability prediction based on deep autoencoder network."

Jie Xiao et al. (2019)

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DOI: 10.1016/J.NEUCOM.2019.07.100

access: closed

type: Journal Article

metadata version: 2024-02-05

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  dblp key:
  - journals/ijon/XiaoMLJHSSY19
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  - https://dblp.org/rec/journals/ijon/XiaoMLJHSSY19
Jie Xiao, Weifeng Ma, Jungang Lou, Jianhui Jiang, Yujiao Huang, Zhanhui Shi, Qing Shen, Xuhua Yang:
Circuit reliability prediction based on deep autoencoder network. Neurocomputing 370: 140-154 (2019)

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