More Web Proxy on the site http://driver.im/

default search action

combined dblp search
author search
venue search
publication search

ask others

"A comprehensive metering scheme for intellectual property protection ..."

Aobo Pan et al. (2013)

> Home

Details and statistics

DOI: 10.1587/ELEX.10.20130649

access: open

type: Journal Article

metadata version: 2024-05-07

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ieiceee/PanLCYLL13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/PanLCYLL13
Aobo Pan, Yaping Lin, Wenjie Che, Zhiqiang You, Yonghe Liu, Jinguo Li:
A comprehensive metering scheme for intellectual property protection during both after-sale and evaluation periods of IC design. IEICE Electron. Express 10(19): 20130649 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.