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"Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt ..."

Yuan Wang et al. (2017)

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DOI: 10.1587/TRANSELE.E100.C.344

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/WangLWZ17
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/WangLWZ17
Yuan Wang, Guangyi Lu, Yize Wang, Xing Zhang:
Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness. IEICE Trans. Electron. 100-C(3): 344-347 (2017)

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