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"Impact of Worst-Case Excitation for DDR interface Signal and Power ..."

Dongzhe Yu, Han Wang, Jiangtao Xu (2020)

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DOI: 10.1007/S10836-020-05875-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Dongzhe Yu, Han Wang, Jiangtao Xu:
Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation. J. Electron. Test. 36(3): 365-374 (2020)

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