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"Testing of static random access memories by monitoring dynamic power ..."

Shyang-Tai Su, Rafic Z. Makki (1992)

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DOI: 10.1007/BF00134735

access: closed

type: Journal Article

metadata version: 2020-09-11

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Shyang-Tai Su, Rafic Z. Makki:
Testing of static random access memories by monitoring dynamic power supply current. J. Electron. Test. 3(3): 265-278 (1992)

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