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"Analysing NBTI Impact on SRAMs with Resistive Defects."

M. Tulio Martins et al. (2017)

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DOI: 10.1007/S10836-017-5685-6

access: closed

type: Journal Article

metadata version: 2021-09-03

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  - journals/et/MartinsMCVP17
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  - https://dblp.org/rec/journals/et/MartinsMCVP17
M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Marcus Pohls:
Analysing NBTI Impact on SRAMs with Resistive Defects. J. Electron. Test. 33(5): 637-655 (2017)

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