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"Determining the optimal probing lot size for the wafer probe operation in ..."

Chih-Hsiung Wang (2009)

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DOI: 10.1016/J.EJOR.2008.05.031

access: closed

type: Journal Article

metadata version: 2020-02-21

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Chih-Hsiung Wang:
Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing. Eur. J. Oper. Res. 197(1): 126-133 (2009)

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