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"A Test Generator IC for Testing Large CMOS-RAMs."

Wilfried Daehn, Josef Gross (1986)

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DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-10-22

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  dblp key:
  - conf/itc/DaehnG86
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  persistent URL:
  - https://dblp.org/rec/conf/itc/DaehnG86
Wilfried Daehn, Josef Gross:
A Test Generator IC for Testing Large CMOS-RAMs. ITC 1986: 18-24

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