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"Understanding gate metal work function (mWF) impact on device reliability ..."

P. Srinivasan et al. (2018)

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DOI: 10.1109/IRPS.2018.8353646

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-18

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  dblp key:
  - conf/irps/SrinivasanRCZKP18
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  - https://dblp.org/rec/conf/irps/SrinivasanRCZKP18
P. Srinivasan, Rakesh Ranjan, S. Cimino, A. Zainuddin, B. Kannan, L. Pantisano, I. Mahmud, G. Dilliway, Tanya Nigam:
Understanding gate metal work function (mWF) impact on device reliability - A holistic approach. IRPS 2018: 6

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