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"Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier ..."

M. Hauser et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764575

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  dblp key:
  - conf/irps/HauserSVKGBPM22
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  - https://dblp.org/rec/conf/irps/HauserSVKGBPM22
M. Hauser, P. Srinivasan, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min:
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. IRPS 2022: 5

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