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"Edge-Eye: Rectifying Millimeter-level Edge Deviation in Manufacturing ..."

Zihao Chu et al. (2022)

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DOI: 10.1109/IPSN54338.2022.00027

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-04

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Zihao Chu, Lei Xie, Tao Gu, Yanling Bu, Chuyu Wang, Sanglu Lu:
Edge-Eye: Rectifying Millimeter-level Edge Deviation in Manufacturing using Camera-enabled IoT Edge Device. IPSN 2022: 247-258

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